DocumentCode
849525
Title
Geometric Analysis of Soft Errors and Oxide Damage Produced by Heavy Cosmic Rays and Alpha Particles
Author
Bradford, John N.
Author_Institution
Rome Air Development Center Deputy for Electronic Technology Hanscom AFB MA 01731
Volume
27
Issue
1
fYear
1980
Firstpage
941
Lastpage
947
Abstract
The interaction of fast heavy ions and alpha particles with microelectronic cells is examined. An analytic expression for the event rate due to the cosmic flux is derived based on the track length distribution in rectangular volumes. Both transient (soft errors) and permanent (oxide damage) effects are considered. The multiple hit consequences of the LSI/VLSI cells lying in a common plane are developed.
Keywords
Alpha particles; Cosmic rays; Error analysis; Large scale integration; Microelectronics; Nuclear electronics; Particle tracking; Radiation effects; Transmission line matrix methods; Very large scale integration;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1980.4330955
Filename
4330955
Link To Document