DocumentCode :
849658
Title :
Voltage breakdown in narrow-base diodes
Author :
Conrad, G. ; Fine, S.
Volume :
51
Issue :
2
fYear :
1963
Firstpage :
405
Lastpage :
405
Keywords :
Breakdown voltage; Conductivity; Dielectric breakdown; Electric breakdown; Epitaxial layers; P-i-n diodes; PIN photodiodes; Schottky diodes; Semiconductor diodes; Space charge;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1828
Filename :
1443758
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=849658
