Title :
Additional Power VMOS Radiation Effects Studies
Author_Institution :
U. S. Army Electronics Research and Development Command Harry Diamond Laboratories Adelphi, Maryland 20783
Keywords :
Electric breakdown; Electrostatics; FETs; Fixtures; Inductors; Neutrons; Pulse measurements; Radiation effects; Testing; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331014
