DocumentCode
850089
Title
Radiation Testing of Recent Vintage 8080A Microprocessors from Several Manufacturers
Author
Martin, Richard L.
Author_Institution
Electrical Engineering Department U. S. Naval Academy Annapolis, MD 21402
Volume
27
Issue
4
fYear
1980
Firstpage
1332
Lastpage
1333
Abstract
A novel radiation experiment was performed using recent vintage 8080A microprocessors from several manufacturers. Functional self tests were continuously monitored during irradiation. Total dose failure levels as well as implications of dose rate dependency and mode of failure are noted.
Keywords
Automatic testing; Condition monitoring; Current measurement; Current supplies; Laboratories; Manufacturing; Microprocessors; Production; Propagation delay; Switches;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1980.4331015
Filename
4331015
Link To Document