DocumentCode

850300

Title

Mesoplasma breakdown in silicon junctions

Author

Power, H.M.

Volume

51

Issue

3

fYear

1963

fDate

3/1/1963 12:00:00 AM

Firstpage

500

Lastpage

501

Keywords

Breakdown voltage; Circuits; Delay effects; Electric breakdown; Light emitting diodes; P-n junctions; Plasma properties; Plasma temperature; Silicon; Switches;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.1890

Filename

1443820