Title :
Assessment of achieved reliability through statistical analysis of field failure data
Author :
Rosenthal, S.A. ; Nathan, I.
Author_Institution :
American Bosch Arma Corp., Garden City, N. Y.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Condition monitoring; Electronic circuits; Electronic equipment; Failure analysis; Logistics; Preventive maintenance; Statistical analysis;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1923
