DocumentCode
85080
Title
Towards a 100 000 TES Focal Plane Array: A Robust, High-Density, Superconducting Cable Interface
Author
Pappas, Christine G.
Author_Institution
Dept. of Phys., Princeton Univ., Princeton, NJ, USA
Volume
25
Issue
3
fYear
2015
fDate
Jun-15
Firstpage
1
Lastpage
5
Abstract
We describe a new fabrication process carried out at the Princeton University Micro/Nano Fabrication Laboratory (MNFL) for creating high-density superconducting cables designed to interface with ACTPol (a polarization-sensitive receiver for the Atacama Cosmology Telescope) detector arrays. A polyimide substrate about 50 μm thick fabricated by spinning and furnace curing a polyimide precursor (HD Microsystems PI-2611) is used for the flexible part of the cable, which gradually transitions to a bare silicon substrate at each end of the cable for a robust wire bonding interface. Aluminum traces 400 nm thick are sputtered on top of the silicon/polyimide hybrid substrate then wet etched into 50-μm-wide traces at a 100 μm pitch. A 10-μm polyimide passivation layer is formed on top of the wiring layer to protect the aluminum traces. To release the flexible part of the cable from the hard silicon substrate reliably without RIE etching tools, we developed a novel process involving backside dicing of the silicon and a gold release layer. The aluminum traces are superconducting with a critical temperature of 1.2 K +/-0.1 K, and a critical current exceeding 5.7 mA at temperatures 1.0 K and below. Aluminum wires 25 μm thick wedge bonded to the cable bond pads have 9.5 g average pull strength.
Keywords
aluminium; critical current density (superconductivity); curing; focal planes; furnaces; lead bonding; metallic thin films; sputter deposition; sputter etching; superconducting cables; superconducting materials; superconducting thin films; superconducting transition temperature; telescopes; ACTPol detector arrays; RIE etching tools; Si; TES focal plane array; aluminum traces; aluminum wires; atacama cosmology telescope detector arrays; critical current; critical temperature; furnace curing; gold release layer; hard silicon substrate; polarization-sensitive receiver; polyimide precursor; robust-high-density superconducting cable interface; silicon-polyimide hybrid substrate; size 100 mum; size 25 mum; size 400 nm; size 50 mum; spinning; sputtering; temperature 1.0 K; wedge; wet etching; wiring layer; Aluminum; Detectors; Polyimides; Silicon; Substrates; Superconducting cables; Wires; ACTPol; aluminum thin films; flexible printed circuits; high-density cables; microfabrication; polyimide films; superconducting cables; superconducting critical current; superconducting detector arrays; superconducting thin films; superconducting transition temperature; wire bonding;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2014.2379092
Filename
6980082
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