DocumentCode

850898

Title

Correction to "ATPG for combinational circuits on configurable hardware"

Author

Kocan, Faith ; Saab, Daniel G.

Author_Institution

Case Western Reserve University

Volume

10

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

374

Lastpage

374

Keywords

Automatic test pattern generation; Combinational circuits; Hardware; Very large scale integration;

fLanguage

English

Journal_Title

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

Publisher

ieee

ISSN

1063-8210

Type

jour

DOI

10.1109/TVLSI.2002.1043340

Filename

1043340