Title :
Correction to "ATPG for combinational circuits on configurable hardware"
Author :
Kocan, Faith ; Saab, Daniel G.
Author_Institution :
Case Western Reserve University
fDate :
6/1/2002 12:00:00 AM
Keywords :
Automatic test pattern generation; Combinational circuits; Hardware; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2002.1043340
