Title :
Temperature and other charadscteristics of thin-film nichrome resistors on various substrate materials
Author_Institution :
U. S. Army Electronics R & D Lab., Fort Monmouth, N. J.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Analytical models; Assembly; Detectors; Preamplifiers; Resistors; Substrates; Temperature; Thin film circuits; Transformers; Transistors;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1950
