DocumentCode
85112
Title
Time Lag of Secondary ESD in Millimeter-Size Spark Gaps
Author
Fayu Wan ; Pilla, Viswa ; Jing Li ; Pommerenke, David ; Shumiya, Hideki ; Araki, Kotaro
Author_Institution
Jiangsu Key Lab. of Meteorol. Obs. & Inf. Process., Nanjing Univ. of Inf. Sci. & Technol., Nanjing, China
Volume
56
Issue
1
fYear
2014
fDate
Feb. 2014
Firstpage
28
Lastpage
34
Abstract
This study relates to the delay of secondary electrostatic discharges (ESDs). The first motivation for this study is the fact that the delay value is a required input parameter for the simulation of the secondary ESD. The second motivation is that this delay is one limiting factor for the usage of spark gaps as protection devices. The objective is to determine the delay for different intended and unintended spark gap structures as this time delay will influence the peak current and rise time of the secondary ESD across these gaps. The intended application is ESD protection in consumer products, for that reason 0.5-3 mm gap distances and voltages up to 14 kV are considered at different humidity levels. Very long time lags are observed for clean sphere-to-sphere gaps requiring average field strengths >200 kV/cm to achieve a breakdown in a few nanoseconds in dry air. Humidity is shown to strongly reduce the time lag. However, if printed circuit board (PCB) spark gap geometries are considered the time lags are much smaller. Similar shorter lag times have been found in geometries that resemble more unintentional breakdown locations in a product.
Keywords
electrostatic discharge; geometry; printed circuits; spark gaps; ESD protection; humidity levels; intended spark gap structures; limiting factor; millimeter-size spark gaps; printed circuit board spark gap geometries; protection devices; secondary ESD time lag; secondary electrostatic discharge delay; sphere-to-sphere gaps; unintended spark gap structures; unintentional breakdown locations; voltage 14 kV; Breakdown voltage; Discharges (electric); Electrostatic discharges; Geometry; Humidity; Voltage measurement; Breakdown; electrostatic discharge (ESD); humidity; time lag;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2013.2275922
Filename
6581867
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