Title :
Theoretical Analysis of the X-Ray Intensity Response of the Ionization Detector Used in the CT System
Author :
Sekihara, Kensuke ; Murayama, Seiichi ; Hayakawa, Takayuki
Author_Institution :
Central Research Laboratory, Hitachi Ltd. Kokubunji, Tokyo, Japan
Abstract :
The intensity response of the ionization chamber as the X-ray detector of the CT-system is theoretically analyzed. Basic equations are derived from charged particles. Using numerical results of these equations, appropriate E/P values, the errors caused by impurities in xenon gas, and the relations between the sensitivity and the electrode separation are discussed.
Keywords :
Electrodes; Electron mobility; Equations; Impurities; Ionization chambers; Laboratories; Spontaneous emission; X-ray detection; X-ray detectors; Xenon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1980.4331122
