DocumentCode
851196
Title
Theoretical Analysis of the X-Ray Intensity Response of the Ionization Detector Used in the CT System
Author
Sekihara, Kensuke ; Murayama, Seiichi ; Hayakawa, Takayuki
Author_Institution
Central Research Laboratory, Hitachi Ltd. Kokubunji, Tokyo, Japan
Volume
27
Issue
6
fYear
1980
Firstpage
1876
Lastpage
1879
Abstract
The intensity response of the ionization chamber as the X-ray detector of the CT-system is theoretically analyzed. Basic equations are derived from charged particles. Using numerical results of these equations, appropriate E/P values, the errors caused by impurities in xenon gas, and the relations between the sensitivity and the electrode separation are discussed.
Keywords
Electrodes; Electron mobility; Equations; Impurities; Ionization chambers; Laboratories; Spontaneous emission; X-ray detection; X-ray detectors; Xenon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1980.4331122
Filename
4331122
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