Session 15 Reliability techniques in components application and evaluation
Author :
Kuehn, R.E.
Author_Institution :
IBM Corp., Owego, N.Y.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
514
Lastpage :
514
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Anisotropic magnetoresistance; Batteries; Conducting materials; Crystalline materials; Degradation; Satellites; Semiconductor diodes; Thin film circuits; Thin film transistors; Voltage control;
