A program of quality assurance for welded electronic circuitry
Author :
Lally, F.A.
Author_Institution :
Boeing Co., Seattle, Wash.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
514
Lastpage :
515
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Anisotropic magnetoresistance; Conducting materials; Crystalline materials; Degradation; Quality assurance; Thermoelectric devices; Thin film circuits; Thin film transistors; Voltage control; Welding;
