Title :
Evaluation of the effect of X-ray detectable defects on electrical performance of semiconductors
Author :
Morris, R.L. ; Wolin, D.
Author_Institution :
Lockheed Missiles and Space Co., Palo Alto, Calif.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Batteries; Gas detectors; Power system reliability; Satellites; Semiconductor diodes; Testing; Voltage control; Wire; X-ray detection; X-ray detectors;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1975
