• DocumentCode
    851257
  • Title

    Comparative surface plasmon spectroscopy for characterisation of thin films

  • Author

    Hlavenkova, Z. ; Homola, Jeffrey

  • Author_Institution
    Inst. of Photonics & Electron. ASCR, Prague
  • Volume
    44
  • Issue
    18
  • fYear
    2008
  • Firstpage
    1085
  • Lastpage
    1086
  • Abstract
    A new method for the characterisation of thin films - comparative surface plasmon spectroscopy - is introduced, and the application of this method for the determination of a refractive index of a thin SiO2 film is described.
  • Keywords
    dielectric thin films; infrared spectroscopy; refractive index; surface plasmons; visible spectroscopy; refractive index; surface plasmon spectroscopy; thin films;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20081959
  • Filename
    4610685
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=851257