Large surface X-ray pixel detector

Author

Delpierre, P. ; Berar, J.F. ; Blanquart, L. ; Boudet, N. ; Breugnon, P. ; Caillot, B. ; Clemens, J.C. ; Mouget, C. ; Potheau, R. ; Valin, I.

Author_Institution

CPPM/IN2P3/CNRS, Marseille, France

Volume

49

Issue

4

fYear

2002

fDate

8/1/2002 12:00:00 AM

Firstpage

1709

Lastpage

1711

Abstract

A large surface semiconductor photon counting pixel detector is being built. As a first step, this detector is optimized for X-ray crystallography. The aim is to provide a high dynamic range (>10⁹), high counting rate (10⁷ ph/s per pixel), and fast image readout (3 ms). A full custom chip has been produced and tested, and results are presented. Prototypes of 6 cm² containing pixels of 330×330 μm² have been built together with a full fast readout system. These prototypes have been tested in the D2am beam line at the ESRF synchrotron (Grenoble, France) for photon energies between 10 and 24 KeV For photon energies above 70 keV, the signal is separable from the noise. We give results on the efficiency as a function of the photon rate and the effect of the threshold on the efficiency in the region between the pixels. Furthermore, to demonstrate the large dynamic range, we made diffraction images.

Keywords

X-ray crystallography; X-ray detection; X-ray diffractometers; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3 ms; 330 micron; D2am beam line; ESRF synchrotron; X-ray crystallography; diffraction images; fast image readout; full custom chip; high counting rate; large surface X-ray pixel detector; large surface semiconductor photon counting pixel detector; photon energies; photon rate; Crystallography; Dynamic range; Pixel; Prototypes; Semiconductor device noise; Synchrotrons; Testing; X-ray detection; X-ray detectors; X-ray imaging;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.801501

Filename

1043457