DocumentCode :
851543
Title :
Analog front-end cell designed in a commercial 0.25 μm process for the ATLAS pixel detector at LHC
Author :
Blanquart, L. ; Richardson, J. ; Denes, P. ; Einsweiler, K. ; Mandelli, E. ; Meddeler, G. ; Fischer, P. ; Ackers, M. ; Comes, G. ; Peric, I.
Author_Institution :
Lawrence Berkeley Nat. Lab., CA, USA
Volume :
49
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
1778
Lastpage :
1782
Abstract :
A new analog pixel front-end cell has been developed for the ATLAS detector at the future Large Hadron Collider (LHC) at the European Laboratory for Particle Physics (CERN). This analog cell has been submitted in two commercial 0.25 μm CMOS processes (in an analog test chip format), using special layout techniques for radiation hardness purposes. It is composed of two cascaded amplifiers followed by a fast discriminator featuring a detection threshold within the range of 1000 to 10000 electrons. The first preamplifier has the principal role of providing a large bandwidth, low input impedance, and fast rise time in order to enhance the time-walk and crosstalk performance, whereas the second fully differential amplifier is aimed at delivering a sufficiently high-voltage gain for optimum comparison. A new do feedback concept renders the cell tolerant of sensor leakage current up to 300 nA and provides monitoring of this current. Two 5-bit digital-to-analog converters tolerant to single-event upset have been implemented for threshold and recovery-time pixel-to-pixel matching purposes. Special attention has been paid to the power-supply rejection ratio to minimize sensitivity to pickup. The complete cell dissipates 30 μW, occupies an area of 50×90 μm2 and is operated with a single 1.6-V power supply. Measurements of two test chips are presented.
Keywords :
CMOS analogue integrated circuits; nuclear electronics; radiation hardening (electronics); silicon radiation detectors; ATLAS detector; CMOS analog integrated circuit; CMOS processes; LHC; Large Hadron Collider; Si; analog pixel front-end cell; analog test chip format; crosstalk performance; detection threshold; digital-to-analog converters; fast discriminator; fully differential amplifier; preamplifier; radiation hardness purposes; time-walk performance; Bandwidth; CMOS process; Crosstalk; Detectors; Electrons; Impedance; Laboratories; Large Hadron Collider; Preamplifiers; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2002.801682
Filename :
1043503
Link To Document :
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