DocumentCode
851612
Title
Low-frequency noise characterization of very large value resistors
Author
Amaboldi, C. ; Bucci, C. ; Cremonesi, O. ; Fascilla, A. ; Nucciotti, A. ; Pavan, M. ; Pessina, G. ; Pirro, S. ; Previtali, E. ; Sisti, M.
Author_Institution
Ist. Nazionale di Fisica Nucl., Milan, Italy
Volume
49
Issue
4
fYear
2002
fDate
8/1/2002 12:00:00 AM
Firstpage
1808
Lastpage
1813
Abstract
A simple circuit configuration is described that allows one to characterize the noise of very large value resistors. With this measurement setup, we investigated, at different bias voltages, the low-frequency noise of large value resistors, tens of GΩ range, realized with different technologies. A technique is suggested that allows reducing the low-frequency noise contribution by optimizing the connecting arrangement. A short review of the resistor noise theory is given.
Keywords
integrated circuit noise; nuclear electronics; resistors; semiconductor device noise; low-frequency noise characterization; low-frequency noise contribution; measurement setup; semiconductor device noise; simple circuit configuration; very large value resistors; Bolometers; Circuits; Detectors; Leak detection; Low-frequency noise; Noise measurement; Resistors; Semiconductor device noise; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.801507
Filename
1043515
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