DocumentCode :
851704
Title :
A Three-Terminal Approach to Developing Spin-Torque Written Magnetic Random Access Memory Cells
Author :
Braganca, Patrick M. ; Katine, Jordan A. ; Emley, Nathan C. ; Mauri, Daniele ; Childress, Jeffrey R. ; Rice, Philip M. ; Delenia, Eugene ; Ralph, Daniel C. ; Buhrman, Robert A.
Author_Institution :
Hitachi Global Storage Technol., San Jose, CA
Volume :
8
Issue :
2
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
190
Lastpage :
195
Abstract :
Using a self-aligned fabrication process together with multiple-step aligned electron beam lithography, we have developed a nanopillar structure where a third contact can be made to any point within a thin-film multilayer stack. This substantially enhances the versatility of the device by providing the means to apply independent electrical biases to two separate parts of the structure. Here, we demonstrate a joint magnetic spin-valve (SV)/tunnel junction structure sharing a common free layer nanomagnet contacted by this third electrode. A spatially nonuniform spin-polarized current flowing into the free layer via the low-resistance SV path can reverse the magnetic orientation of the free layer as a consequence of the spin-torque (ST) effect, by nucleating a reversal domain at the spin injection site that propagates across the free layer. The free layer magnetic state can then be read out separately via the higher resistance magnetic tunnel junction (MTJ). This three-terminal structure provides a strategy for developing high-performance ST magnetic random access memory (ST-MRAM) cells, which avoids the need to apply a large voltage across a MTJ during the writing step, thereby enhancing device reliability, while retaining the benefits of a high-impedance MTJ for read-out.
Keywords :
MRAM devices; electron beam lithography; magnetic multilayers; magnetic tunnelling; nanotechnology; reliability; spin polarised transport; spin valves; device reliability; free layer nanomagnet; magnetic random access memory cells; magnetic spin-valve-tunnel junction structure; magnetic tunnel junction; multiple-step aligned electron beam lithography; nanopillar structure; self-aligned fabrication process; spatially nonuniform spin-polarized current; spin injection site; spin-torque; spin-torque effect; thin-film multilayer stack; three-terminal structure; Magnetic memories; magnetic tunnel junctions (MTJs); nanofabrication; spin torque (ST);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2008.2005187
Filename :
4610963
Link To Document :
بازگشت