• DocumentCode
    851704
  • Title

    A Three-Terminal Approach to Developing Spin-Torque Written Magnetic Random Access Memory Cells

  • Author

    Braganca, Patrick M. ; Katine, Jordan A. ; Emley, Nathan C. ; Mauri, Daniele ; Childress, Jeffrey R. ; Rice, Philip M. ; Delenia, Eugene ; Ralph, Daniel C. ; Buhrman, Robert A.

  • Author_Institution
    Hitachi Global Storage Technol., San Jose, CA
  • Volume
    8
  • Issue
    2
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    190
  • Lastpage
    195
  • Abstract
    Using a self-aligned fabrication process together with multiple-step aligned electron beam lithography, we have developed a nanopillar structure where a third contact can be made to any point within a thin-film multilayer stack. This substantially enhances the versatility of the device by providing the means to apply independent electrical biases to two separate parts of the structure. Here, we demonstrate a joint magnetic spin-valve (SV)/tunnel junction structure sharing a common free layer nanomagnet contacted by this third electrode. A spatially nonuniform spin-polarized current flowing into the free layer via the low-resistance SV path can reverse the magnetic orientation of the free layer as a consequence of the spin-torque (ST) effect, by nucleating a reversal domain at the spin injection site that propagates across the free layer. The free layer magnetic state can then be read out separately via the higher resistance magnetic tunnel junction (MTJ). This three-terminal structure provides a strategy for developing high-performance ST magnetic random access memory (ST-MRAM) cells, which avoids the need to apply a large voltage across a MTJ during the writing step, thereby enhancing device reliability, while retaining the benefits of a high-impedance MTJ for read-out.
  • Keywords
    MRAM devices; electron beam lithography; magnetic multilayers; magnetic tunnelling; nanotechnology; reliability; spin polarised transport; spin valves; device reliability; free layer nanomagnet; magnetic random access memory cells; magnetic spin-valve-tunnel junction structure; magnetic tunnel junction; multiple-step aligned electron beam lithography; nanopillar structure; self-aligned fabrication process; spatially nonuniform spin-polarized current; spin injection site; spin-torque; spin-torque effect; thin-film multilayer stack; three-terminal structure; Magnetic memories; magnetic tunnel junctions (MTJs); nanofabrication; spin torque (ST);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2005187
  • Filename
    4610963