DocumentCode
851704
Title
A Three-Terminal Approach to Developing Spin-Torque Written Magnetic Random Access Memory Cells
Author
Braganca, Patrick M. ; Katine, Jordan A. ; Emley, Nathan C. ; Mauri, Daniele ; Childress, Jeffrey R. ; Rice, Philip M. ; Delenia, Eugene ; Ralph, Daniel C. ; Buhrman, Robert A.
Author_Institution
Hitachi Global Storage Technol., San Jose, CA
Volume
8
Issue
2
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
190
Lastpage
195
Abstract
Using a self-aligned fabrication process together with multiple-step aligned electron beam lithography, we have developed a nanopillar structure where a third contact can be made to any point within a thin-film multilayer stack. This substantially enhances the versatility of the device by providing the means to apply independent electrical biases to two separate parts of the structure. Here, we demonstrate a joint magnetic spin-valve (SV)/tunnel junction structure sharing a common free layer nanomagnet contacted by this third electrode. A spatially nonuniform spin-polarized current flowing into the free layer via the low-resistance SV path can reverse the magnetic orientation of the free layer as a consequence of the spin-torque (ST) effect, by nucleating a reversal domain at the spin injection site that propagates across the free layer. The free layer magnetic state can then be read out separately via the higher resistance magnetic tunnel junction (MTJ). This three-terminal structure provides a strategy for developing high-performance ST magnetic random access memory (ST-MRAM) cells, which avoids the need to apply a large voltage across a MTJ during the writing step, thereby enhancing device reliability, while retaining the benefits of a high-impedance MTJ for read-out.
Keywords
MRAM devices; electron beam lithography; magnetic multilayers; magnetic tunnelling; nanotechnology; reliability; spin polarised transport; spin valves; device reliability; free layer nanomagnet; magnetic random access memory cells; magnetic spin-valve-tunnel junction structure; magnetic tunnel junction; multiple-step aligned electron beam lithography; nanopillar structure; self-aligned fabrication process; spatially nonuniform spin-polarized current; spin injection site; spin-torque; spin-torque effect; thin-film multilayer stack; three-terminal structure; Magnetic memories; magnetic tunnel junctions (MTJs); nanofabrication; spin torque (ST);
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2008.2005187
Filename
4610963
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