Massachusetts Institute of Technology, Cambridge, Mass.
Volume :
51
Issue :
3
fYear :
1963
fDate :
3/1/1963 12:00:00 AM
Firstpage :
521
Lastpage :
521
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Calibration; Communication networks; Displays; Inspection; Instruments; Operational amplifiers; Oscilloscopes; Power amplifiers; Standards development; Voltage;
