DocumentCode
852062
Title
High frequency dynamic imaging of domains in thin film heads
Author
Liu, Francis H. ; Schultz, Mark D. ; Kryder, Mark H.
Author_Institution
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
26
Issue
5
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
1340
Lastpage
1342
Abstract
A wide-field magnetooptic domain observation system with a time resolution of 10 ns has been developed to study magnetization dynamics in thin-film heads. The instantaneous dynamic response on the top yoke of thin-film recording heads is examined at any chosen instant within the drive current cycle at frequencies up to 20 MHz. Different phase responses from different domain walls in the head are observed and interpreted in terms of hysteretic wall motion, effective field density variation in the head, and wall orientations relative to the flux conduction direction. Two different flux conduction mechanisms associated with two different domain structures in the central region of the head are observed and discussed. Flux conduction in the center of the head by motion of backgap walls and magnetization rotation for domain structures with and without the backgap walls was observed. The domain structure with the backgap walls is probably undesirable because the backgap wall motion may cause a decrease in head efficiency during high-frequency operation and could cause noise during read-back
Keywords
magnetic domains; magnetic heads; magnetic recording; magnetic thin films; 10 ns; 20 MHz; backgap walls; domains; effective field density variation; flux conduction direction; high-frequency operation; hysteretic wall motion; instantaneous dynamic response; magnetization dynamics; magnetization rotation; noise; read-back; thin film heads; time resolution; wall orientations; wide-field magnetooptic domain observation system; Cameras; Delay; Frequency; Magnetic heads; Magnetic recording; Magnetization; Magnetooptic effects; Magnetooptic recording; Optical noise; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.104368
Filename
104368
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