DocumentCode :
852072
Title :
Three-dimensional magnetic field measurement of a modified thin-film magnetic head for vertical recording by means of Lorentz-tomography
Author :
Steck, M. ; Schewe, H. ; Kubalek, E.
Author_Institution :
Werkstoffe der Elektrotech., Duisburg Univ., West Germany
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
1343
Lastpage :
1345
Abstract :
The method of Lorentz tomography with an electron beam as a microprobe, combined with an analytical reconstruction procedure, has been successfully adapted to thin-film heads for vertical recording. It is noted that the measured results can be used as a basis for adjusting the magnetic parameters of the thin-film head to achieve good agreement with corresponding FEM or BEM (finite element or boundary element method) calculations. It is concluded that Lorentz tomography can be used as an important tool in the design of thin-film magnetic heads
Keywords :
magnetic heads; magnetic recording; magnetic thin films; 3D magnetic field measurement; Lorentz-tomography; boundary element method; finite element; magnetic parameters; modified thin-film magnetic head; vertical recording; Boundary element methods; Electron beams; Finite element methods; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic heads; Perpendicular magnetic recording; Tomography; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104369
Filename :
104369
Link To Document :
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