Characterization of component films in multilayer magneto-optic structures

Author

McGahan, William A. ; He, Ping ; Chen, Liang-Yao ; Woollam, John A.

Author_Institution

Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

1346

Lastpage

1348

Abstract

A procedure involving normal-angle-of-incidence Kerr spectroscopy, variable-angle-of-incidence spectroscopic ellipsometry, and variable-angle-of-incidence spectroscopic magnetooptic ellipsometry has been developed. It makes it possible to extract layer thicknesses and optical and magnetooptical constants from individual layers within multilayered structures. The procedure is nondestructive, and it has been successfully applied to several materials systems, including Ag:Dy/Co:SiO. In addition, the advantages and disadvantages of this procedure as a means of studying component layers in multilayer films are discussed

Keywords

magnetic thin films; magneto-optical devices; Ag:Dy-Co:SiO; component films; individual layers; layer thicknesses; magnetooptical constants; multilayer magneto-optic structures; multilayered structures; normal-angle-of-incidence Kerr spectroscopy; optical constants; variable-angle-of-incidence spectroscopic ellipsometry; variable-angle-of-incidence spectroscopic magnetooptic ellipsometry; Ellipsometry; Magnetic analysis; Magnetic multilayers; Magnetooptic effects; Nonlinear optics; Optical films; Optical materials; Optical refraction; Optical sensors; Spectroscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104370

Filename

104370