• DocumentCode
    852365
  • Title

    Epitaxial Silicon Position Sensitive Detectors

  • Author

    Shiraishi, F. ; Kim, C. ; Kim, H. ; Kikuchi, K. ; Husimi, K. ; Ohkawa, S.

  • Author_Institution
    Institute for Atomic Energy, Rikkyo University Yokosuka, Kanagawa 240-01, Japan
  • Volume
    28
  • Issue
    1
  • fYear
    1981
  • Firstpage
    554
  • Lastpage
    557
  • Abstract
    A position sensitive detector has been made on a N-type epitaxial silicon wafer using the epitaxial layer as the uniform resistive layer. The surface barrier electrode is produced on the opposite side of the epitaxial layer by evaporation of gold. The position sensitive detector obtained has good characteristics and moreover it is easy to fabricate. So that the epitaxial technique will be promising even over the conventional ion implantation technique for fabrication of position sensitive silicon detector.
  • Keywords
    Conductivity; Electrical resistance measurement; Electrodes; Epitaxial layers; Fabrication; Gold; Position sensitive particle detectors; Silicon; Substrates; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4331238
  • Filename
    4331238