• DocumentCode
    852406
  • Title

    Preparation method and RF behaviour of Nb/sub 3/Sn thin films obtained by bronze process

  • Author

    Durante, M.J. ; Musenich, R. ; Parodi, R. ; Gemme, G. ; Fabbricatore, P. ; Zhang, B. ; Gambardella, U. ; Boffa, V. ; Bottino, C. ; Buscaglia, V.

  • Author_Institution
    Istituto Nazionale di Fisica Nucl., Genova, Italy
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    837
  • Lastpage
    840
  • Abstract
    Aiming to application in RF devices, a method to obtain Nb/sub 3/Sn thin films, combining sputtering technique and bronze process, has been developed. A niobium film, 300-500 nm thick, is deposited by sputtering onto a 7 at.% tin bronze substratum. In order to allow the diffusion of tin into niobium and the formation of the A15 phase, the sample is maintained at about 700/spl deg/C during the deposition, and for several hours after the deposition. A Nb/sub 3/Sn film with very good adhesion on the substratum has been obtained. The RF behaviour of the film has been analyzed at about 10 GHz at temperature near Tc, using a host copper cavity having the top plate substituted with the bronze-Nb/sub 3/Sn sample. Both the quality factor and the frequency shift have been measured.<>
  • Keywords
    Q-factor; adhesion; electric impedance; niobium alloys; penetration depth (superconductivity); sputter deposition; superconducting cavity resonators; superconducting microwave devices; superconducting thin films; tin alloys; type II superconductors; 10 GHz; 300 to 500 nm; 700 C; A15 phase; CuSn; Nb/sub 3/Sn; Nb/sub 3/Sn thin films; RF behaviour; Sn diffusion; adhesion; bronze process; frequency shift measurement; host copper cavity; impedance measurement; preparation method; quality factor; sputtering technique; Adhesives; Copper; Frequency measurement; Niobium; Q factor; Radio frequency; Sputtering; Temperature; Thin film devices; Tin;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402678
  • Filename
    402678