DocumentCode
852710
Title
Proton-neutron damage correlation in semiconductors
Author
Bilinski, J.R. ; Brooks, E.H. ; Cocca, U. ; Maier, Robert
Author_Institution
General Electric Co., Syracuse, N. Y.
Volume
51
Issue
3
fYear
1963
fDate
3/1/1963 12:00:00 AM
Firstpage
530
Lastpage
530
Abstract
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords
Microwave theory and techniques; NASA; Neutrons; Noise level; Optimal control; Protons; Radar applications; Radar tracking; Semiconductor diodes; Silicon;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.2114
Filename
1444044
Link To Document