DocumentCode
852835
Title
Nonuniformity of electrical Characteristics in microstructures of ZnO surge varistors
Author
He, Jinliang ; Zeng, Rong ; Chen, Qingheng ; Chen, Shuiming ; Guan, Zhicheng ; Han, Se-Won ; Cho, Han-Goo
Author_Institution
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Volume
19
Issue
1
fYear
2004
Firstpage
138
Lastpage
144
Abstract
The nonuniformity of electrical characteristics of grain boundaries in ZnO varistors was systematically analyzed. The high nonuniformity exists in barrier voltages and nonlinearity coefficients in different grain boundaries. The barrier voltages have normal distributions, only a few grain boundaries were electrically active, and the grain boundaries can be simply classified into good, bad, and ohmic ones according to the electrical characteristics of grain boundaries. The average barrier voltage is equal to 3.3 V by the direct method, but it is only 2.3 V by the indirect method. There is a high difference between the barrier voltages by direct and indirect measurement methods. These few good grain boundaries are responsible for the good varistor effect, and control the leakage current of ZnO varistor at low values of applied voltage. The Al2O3 dopants affect the electrical characteristics of grain boundaries by changing the electron status in grain boundary and intragrain.
Keywords
electric current control; grain boundaries; leakage currents; normal distribution; surge protection; varistors; zinc compounds; 2.3 V; 3.3 V; Al2O3; ZnO; ZnO surge varistors microstructures; barrier voltages; dopants; electrical characteristics nonuniformity; grain boundaries; indirect measurement methods; leakage current; nonlinearity coefficients; Electric variables; Electrons; Gaussian distribution; Grain boundaries; Leakage current; Microstructure; Surges; Varistors; Voltage control; Zinc oxide;
fLanguage
English
Journal_Title
Power Delivery, IEEE Transactions on
Publisher
ieee
ISSN
0885-8977
Type
jour
DOI
10.1109/TPWRD.2003.820214
Filename
1256369
Link To Document