• DocumentCode
    853028
  • Title

    Advances in excimer laser technology for sub-0.25-μm lithography

  • Author

    Das, Palash ; Sandstrom, Richard L.

  • Author_Institution
    Cymer, Inc., San Diego, CA, USA
  • Volume
    90
  • Issue
    10
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1637
  • Lastpage
    1652
  • Abstract
    There are several lasers that can provide high-power radiation at deep-UV wavelengths. The only laser that has been successfully used in semiconductor manufacturing as a source for lithography is the excimer laser Excimer lasers provide direct deep-UV light, are scalable in energy and power, and are capable of operating with narrow spectral widths. Also, by providing three wavelengths at 248, 193, and 157 nm, excimer lasers span three generations. They have large beams and a low degree of coherence. Their physics and chemistry are well understood. Thanks to major technical developments, these lasers have kept up with the ever-tightening specifications of the lithography industry. We will discuss what these specifications are and the advances that have been made in laser technology to meet these. We will also identify any possible future limitation in this technology. The success behind the microelectronics explosion is attributed to many factors. The excimer laser is one of them.
  • Keywords
    argon compounds; excimer lasers; fluorine; krypton compounds; laser stability; ultraviolet lithography; 0.25 micron; 157 nm; 193 nm; 248 nm; ArF; ArF lasers; F2; F2 lasers; KrF; KrF lasers; deep-UV wavelengths; energy scalability; excimer laser technology; large beams; lithography industry specifications; lithography source; low coherence; narrow spectral widths; power scalability; semiconductor manufacturing; sub-0.25-μm lithography; Chemical lasers; Chemistry; Coherence; Laser beams; Laser theory; Lithography; Physics; Power lasers; Semiconductor device manufacture; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2002.803665
  • Filename
    1043923