• DocumentCode
    853046
  • Title

    High-speed microvia formation with UV solid-state lasers

  • Author

    Dunsky, Corey

  • Author_Institution
    Adv. Packaging Products Div., Electro Sci. Industries, Portland, OR, USA
  • Volume
    90
  • Issue
    10
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1670
  • Lastpage
    1680
  • Abstract
    Laser drilling has emerged in the last five years as the most widely accepted method of creating microvias in high-density electronic interconnect and chip packaging devices. Most commercially available laser drilling tools are currently based on one of two laser types: far-IR CO2 lasers and UV solid-state lasers at 355 nm. While CO2 lasers are recognized for their high average power and drilling throughput, UV lasers are known for high-precision material removal and their ability to drill the smallest vias, with diameters down to about 25-30 μm now achievable in production. This paper presents an historical overview of techniques for drilling microvias with UV solid-state lasers. Blind and through via formation by percussion drilling, trepanning, spiralling, and image projection with a shaped beam are discussed. Advantages and range of applicability of each technique are summarized. Drivers of throughput scaling over the last five years are outlined, and representative current-generation performance is presented.
  • Keywords
    integrated circuit interconnections; integrated circuit manufacture; integrated circuit packaging; laser beam machining; solid lasers; 25 to 30 micron; 355 nm; UV solid-state lasers; blind via formation; chip packaging devices; current-generation performance; high-density electronic interconnect; high-precision material removal; high-speed microvia formation; historical overview; percussion drilling; shaped beam image projection; small via drilling; spiralling; through via formation; throughput scaling; trepanning; Drilling; Electronics packaging; Integrated circuit interconnections; Lamination; Power lasers; Production; Semiconductor device packaging; Solid lasers; Throughput; Wiring;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2002.803663
  • Filename
    1043925