DocumentCode :
853204
Title :
Nomographs to Determine the Effective Thickness of X-Ray Shields
Author :
Zanker, Adam
Author_Institution :
Kiriat - Jam "G" , P. O. B.-11, Israel
Volume :
28
Issue :
1
fYear :
1981
Firstpage :
985
Lastpage :
988
Abstract :
All kinds of matter (gases, liquids and solids) have the ability of reducing the intensity of X-Rays. This property depends on the wave lenght of an X-Ray, and of the kind of matter used for this purpose. As a rule, some metals are known to be the best shields (screens) against X-Rays. An X-Ray screen of a specified thickness which absorbs one-half of the initial radiation intensity of a given wave length, is defined as a "half-layer-screen". A Nomograph is presented, which allows to find in the quickest possible time the "hslf-layer-thickness" of X-Ray screens, prepared from a number of the most commonly used materials. The second Nomograph presented enables to find the desired thickness of an X-Ray screen which reduces the initial radiation intensity to any level wanted.
Keywords :
Electromagnetic wave absorption; Protection; Solids;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1981.4331317
Filename :
4331317
Link To Document :
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