DocumentCode :
853240
Title :
The effects of deposition parameters on iron films RF diode sputtered in argon-nitrogen
Author :
Jones, R.E., Jr. ; Williams, J. ; Staud, N.
Author_Institution :
IBM Corp., San Jose, CA, USA
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
1456
Lastpage :
1458
Abstract :
Iron-nitrogen films deposited in an argon-N2 sputtering gas were characterized as a function of RF diode sputtering parameters and the N2 partial pressure. The magnetic properties of the films were generally soft until they contained about 1 at.% nitrogen, which corresponded to an impingement rate ratio of nitrogen to iron of about 400 to 1. At that composition Hc and Hk increased abruptly. Optimum substrate bias was found to depend on the substrate used. Annealed films exhibited significant decreases in Hc and Hk , and the saturation magnetostriction could be adjusted to near zero by adding nitrogen. Corrosion properties were also improved with added nitrogen
Keywords :
corrosion; iron compounds; magnetic thin films; magnetostriction; sputter deposition; Fe-N; N2 partial pressure; RF diode sputtering; corrosion; deposition parameters; films; saturation magnetostriction; Annealing; Corrosion; Diodes; Iron; Magnetic films; Magnetic properties; Magnetostriction; Nitrogen; Radio frequency; Sputtering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104409
Filename :
104409
Link To Document :
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