DocumentCode
853423
Title
Dynamic measurement in titanium thin-film resistors
Author
Quinn, R.A. ; Kaiser, H.R.
Author_Institution
Lockheed Missile and Space Co., Palo Alto, Calif.
Volume
51
Issue
3
fYear
1963
fDate
3/1/1963 12:00:00 AM
Firstpage
537
Lastpage
537
Abstract
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords
Aerospace engineering; Computational modeling; Electronics packaging; Refrigeration; Resistors; Reverberation; Thermal force; Titanium; Transistors; Welding;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.2188
Filename
1444118
Link To Document