• DocumentCode
    85382
  • Title

    Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

  • Author

    Jeong, Sangkwon ; Lee, Edward ; Yim, Mark ; Yoon, Giwan

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • Volume
    50
  • Issue
    2
  • fYear
    2014
  • fDate
    January 16 2014
  • Firstpage
    98
  • Lastpage
    100
  • Abstract
    A few-layer-thick epitaxial graphene synthesised on both the up-side and the down-side surfaces of SiC wafers in an ultra-high vacuum annealing furnace is presented. The graphene grown on the down-side surfaces of the SiC wafers that contacted with a graphite pedestal resulted in a relatively lower sheet resistance along with less graphene layers, as compared with that of their up-side surfaces. Overall, the sheet resistance of the few-layer-thick graphene grown on the down-side was found to range from 200 to 3 Ω/□, depending on the annealing time.
  • Keywords
    annealing; electric resistance; graphene; semiconductor epitaxial layers; silicon compounds; substrates; C; SiC; SiC substrates; down-side surfaces; epitaxial graphene layers; sheet resistance; ultra-high vacuum annealing furnace; up-side surfaces;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2013.3391
  • Filename
    6729331