Title :
Soft magnetic properties of Fe-N and Fe-Si-N thin films sputtered in (Ar+N2) plasma
Author :
Takahashi, M. ; Shoji, H. ; Shimatsu, T. ; Komaba, H. ; Wakiyama, T.
Author_Institution :
Dept. of Electron. Eng., Tohuku Univ., Sendai, Japan
fDate :
9/1/1990 12:00:00 AM
Abstract :
The soft magnetic properties of sputtered (0~3-wt%) Si-Fe alloy thin films fabricated in (Ar+N2) plasma were investigated in connection with metallurgical structure. 2.7-wt% Si-Fe film annealed at 400°C shows a high effective permeability μeff of about 1600 at 5 MHz. It has been observed that this film consists of α-Fe with a grain size of less than 150 Å and a slight expansion of lattice spacing of the (110) plane. To understand the magnetoelastic effect on permeability, the total magnetic anisotropy in the (110) plane of each grain, U(110), was calculated for shear and tetragonal deformation modes. U(110) increases with increasing strain for the shear deformation mode, whereas it decreases as the positive strain increases and has a minimum for the tetragonal deformation mode. It is suggested that the decrease in total magnetic anisotropy in each grain through the magnetostrictive anisotropy due to tetragonal deformation and the reduction of grain size are essential for realizing high μeff for Fe-Si films
Keywords :
ferromagnetic properties of substances; grain size; iron alloys; magnetic anisotropy; magnetic permeability; magnetic thin films; magnetostriction; silicon alloys; sputter deposition; α-Fe; (Ar+N2) plasma; 400 degC; 5 MHz; Fe-N; Fe-Si; Fe-Si-N thin films; annealing; grain size; high effective permeability; lattice spacing; magnetoelastic effect; magnetostrictive anisotropy; metallurgical structure; shear deformation; soft magnetic properties; strain; tetragonal deformation modes; total magnetic anisotropy; Grain size; Magnetic anisotropy; Magnetic field induced strain; Magnetic films; Magnetic properties; Magnetostriction; Permeability; Perpendicular magnetic anisotropy; Soft magnetic materials; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on