• DocumentCode
    854277
  • Title

    Chemical Effects in the PIXE Analysis of Fluorine

  • Author

    Deconninck, G. ; Van Den Broek, S.

  • Author_Institution
    L.A.R.N., Facultés Universitaires de Namur, Namur, Belgium
  • Volume
    28
  • Issue
    2
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    1404
  • Lastpage
    1406
  • Abstract
    Spectra of X-rays induced by 2 MeV 4He bombardment of 24 samples of different fluorine compounds are presented. Important chemical effects are seen in the spectrum shape. The application of these effects to chemical analysis is demonstrated on samples of fluorine implanted in iron.
  • Keywords
    Atomic measurements; Chemical analysis; Chemical elements; Satellites; Shape; Solids; Spectroscopy; Surface contamination; Uninterruptible power systems; X-rays;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4331427
  • Filename
    4331427
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=854277