Title :
Chemical Effects in the PIXE Analysis of Fluorine
Author :
Deconninck, G. ; Van Den Broek, S.
Author_Institution :
L.A.R.N., Facultés Universitaires de Namur, Namur, Belgium
fDate :
4/1/1981 12:00:00 AM
Abstract :
Spectra of X-rays induced by 2 MeV 4He bombardment of 24 samples of different fluorine compounds are presented. Important chemical effects are seen in the spectrum shape. The application of these effects to chemical analysis is demonstrated on samples of fluorine implanted in iron.
Keywords :
Atomic measurements; Chemical analysis; Chemical elements; Satellites; Shape; Solids; Spectroscopy; Surface contamination; Uninterruptible power systems; X-rays;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4331427
