• DocumentCode
    854344
  • Title

    OBDD-based evaluation of k-terminal network reliability

  • Author

    Yeh, Fu-Min ; Lu, Shyue-Kung ; Kuo, Sy-Yen

  • Author_Institution
    Electron. Syst. Res. Div., Chung-Shan Inst. of Sci. & Technol., Taoyuan, Taiwan
  • Volume
    51
  • Issue
    4
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    451
  • Abstract
    An efficient approach to determining the reliability of an undirected k-terminal network based on 2-terminal reliability functions is presented. First, a feasible set of (k-1) terminal-pairs is chosen, and the 2-terminal reliability functions of the (k-1) terminal-pairs are generated based on the edge expansion diagram using an OBDD (ordered binary decision diagram). Then the k-terminal reliability function can be efficiently constructed by combining these (k-1) reliability expressions with the Boolean and operation. Because building 2-terminal reliability functions and reducing redundant computations by merging reliability functions can be done very efficiently, the proposed approaches are much faster than those which directly expand the entire network or directly factor the k-terminal networks. The effectiveness of this approach is demonstrated by performing experiments on several large benchmark networks. An example of appreciable improvement is that the evaluation of the reliability of a source-terminal 3×10 all-terminal network took only 2.4 seconds on a SPARC 20 workstation. This is much faster than previous factoring-algorithms.
  • Keywords
    Boolean functions; binary decision diagrams; reliability theory; (k-1) terminal-pairs generation; 2-terminal reliability functions; Boolean and operation; edge expansion diagram; ordered binary decision diagram; redundant computations reduction; source-terminal 3×10 all-terminal network; terminal-pair reliability; undirected k-terminal network reliability; Boolean functions; Buildings; Computer networks; Data structures; Merging; NP-hard problem; Partitioning algorithms; Workstations;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2002.804736
  • Filename
    1044342