• DocumentCode
    855143
  • Title

    Microwave measurement of conductivity and dielectric constant of semiconductors

  • Author

    Nag, B.R. ; Roy, Sandip Kumar

  • Volume
    51
  • Issue
    6
  • fYear
    1963
  • fDate
    6/1/1963 12:00:00 AM
  • Firstpage
    962
  • Lastpage
    962
  • Keywords
    Conductivity measurement; Dielectric constant; Dielectric measurements; Frequency measurement; Germanium; Impedance; Length measurement; Microwave measurements; Q measurement; Semiconductor waveguides;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.2366
  • Filename
    1444296
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=855143