Title :
Microwave measurement of conductivity and dielectric constant of semiconductors
Author :
Nag, B.R. ; Roy, Sandip Kumar
fDate :
6/1/1963 12:00:00 AM
Keywords :
Conductivity measurement; Dielectric constant; Dielectric measurements; Frequency measurement; Germanium; Impedance; Length measurement; Microwave measurements; Q measurement; Semiconductor waveguides;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.2366
