DocumentCode :
855167
Title :
Improved performance by optimised planar doped barrier launcher in GaAs vertical FET with very short channel width
Author :
Won, Y.H. ; Yamasaki, K. ; Daniels-Race, T. ; Tasker, P.J. ; Schoff, W.J. ; Eastman, L.F.
Author_Institution :
Sch. of Electr. Eng. & Nat. Nanofabrication Facility, Cornell Univ., Ithaca, NY, USA
Volume :
25
Issue :
21
fYear :
1989
Firstpage :
1413
Lastpage :
1414
Abstract :
The current-voltage characteristics of a GaAs vertical field effect transistor (VFET) with an n+ip+in+ planar doped barrier (PDB) launcher has been successfully improved by the optimisation of the launcher structure as well as the reduction of the channel width. Electron-beam direct writing has been used to obtain a small channel width of 0.1 approximately 0.15 mu m, resulting in good pinchoff characteristics. The measured maximum transconductances are 383 and 220 mS/mm at 77 and 300 K, respectively. In spite of a very short channel length (0.1 mu m) and relatively low channel doping density (5*1016 cm-3), a high voltage gain of 15 has been obtained.
Keywords :
III-V semiconductors; doping profiles; electron beam lithography; field effect transistors; gallium arsenide; 0.1 micron; 300 K; 77 K; GaAs; channel doping density; channel width; current-voltage characteristics; maximum transconductances; n +ip +in + planar doped barrier; optimised planar doped barrier launcher; pinchoff characteristics; vertical field effect transistor; very short channel width; voltage gain;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890943
Filename :
46217
Link To Document :
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