Title :
Magnetoelastic properties of very thin Co-alloy films
Author :
Mauri, D. ; Speriosu, V.S. ; Yogi, T. ; Castillo, G. ; Peterson, D.T.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
9/1/1990 12:00:00 AM
Abstract :
The magnetoelastic properties of thin longitudinal Co-alloy films were investigated by measuring the changes in the hysteresis loop during and after the application of a mechanical strain. Co, Co90Pt 10, Co88Cr12, and Co78Pt10Cr12 thin films, ranging in thickness and from 250 to 3000 Å, were deposited on Mylar substrates and subjected to bending strains in the 10-3 range. For all samples the coercivity, coercive squareness, and remanent squareness decreased along the tensile axis, consistent with a negative magnetostriction constant. The magnetoelastic effects were found to scale approximately as Hc-1. The consequences of these observations for magnetic recording-in particular, stress-induced signal loss and transition broadening-are discussed. It is pointed out that temporary application of stress on a recorded medium can have a twofold effect: a partial demagnetization of the recorded cells and a broadening of the transitions. It is estimated that, for the type of alloys investigated, both these effects should be on the order of a few percent per 1% strain for coercivities of 1000 Oe
Keywords :
cobalt alloys; coercive force; demagnetisation; magnetic hysteresis; magnetic recording; magnetic thin films; magnetic transitions; magnetoelastic effects; magnetostriction; remanence; Co; Co78Pt10Cr12; Co88Cr12; Co90Pt10; Mylar substrates; bending strains; coercive squareness; coercivity; hysteresis loop; magnetic recording; magnetoelastic properties; mechanical strain; negative magnetostriction constant; partial demagnetization; remanent squareness; stress-induced signal loss; thin longitudinal Co-alloy films; transition broadening; Chromium; Coercive force; Magnetic field induced strain; Magnetic hysteresis; Magnetic properties; Magnetostriction; Mechanical variables measurement; Sputtering; Strain measurement; Stress;
Journal_Title :
Magnetics, IEEE Transactions on