DocumentCode :
855213
Title :
Power Hardware-in-the-Loop Testing of a YBCO Coated Conductor Fault Current Limiting Module
Author :
Schacherer, Christian ; Langston, James ; Steurer, Michael ; Noe, Mathias
Author_Institution :
Inst. for Tech. Phys., Forschungszentrum Karlsruhe (KIT), Karlsruhe, Germany
Volume :
19
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
1801
Lastpage :
1805
Abstract :
In recent years, good progress has been made in improving the quality and quantity afforded by the manufacturing process for YBCO coated conductors. As a result, several programs have started to develop electrical power applications like motors, transformers, and fault current limiters (SCFCL) with these conductors. High voltage resistive type SCFCLs may typically be assembled from modules connected in series and parallel to accommodate the required voltage and current levels. The limited length of such a SCFCL module simplifies the configuration, manufacturing, and maintenance. It also allows testing of these modules under laboratory conditions at reduced power levels. In order to test SCFCL modules under conditions they will experience in high voltage electrical networks, advanced test methods such as power hardware-in-the-loop (PHIL) can offer significant advantages. This method allows studying conditions such as voltage stability and severe system perturbations with the actual SCFCL module in the loop. Hence, the quench and recovery behavior of the SCFCL module can be investigated under conditions characteristic of real electrical power networks without elaborate experimental setups. This paper presents results from PHIL experiments with a SCFCL module consisting of an approx. 10 m coated conductor.
Keywords :
barium compounds; copper compounds; fault current limiters; superconducting devices; yttrium compounds; SCFCL; YBCO; coated conductor fault current limiting module; electrical power networks; fault current limiters; motors; power hardware-in-the-loop testing; severe system perturbations; transformers; voltage stability; Power-hardware-in-the-loop; superconducting fault current limiter; test method;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2009.2018048
Filename :
4914765
Link To Document :
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