• DocumentCode
    855301
  • Title

    Delay times for switching in-line cryotrons

  • Author

    Brennemann, A.E. ; Mcnichol, J.J. ; Seraphim, D.P.

  • Author_Institution
    IBM Corporation, Yorktown Heights, N. Y.
  • Volume
    51
  • Issue
    7
  • fYear
    1963
  • fDate
    7/1/1963 12:00:00 AM
  • Firstpage
    1009
  • Lastpage
    1014
  • Abstract
    The delay time involved in switching indium cryotrons is investigated as a function of the applied magnetic control fields. For overdrive fields greater than the isothermal critical magnetic field, but smaller than the constant-entropy critical magnetic field, the rate of transition appears to be controlled by the rate of supply of latent heat from the environment. In this range of overdrive, delay times (for build-up of full resistance) experimentally determined and calculated with overdrive and temperature as controlled variables are in the range of 0.1 to 1 µsec in good quantitative agreement. For overdrive fields 40 per cent above the critical magnetic field, the delay times (10 to 40 nsec) for build-up of full resistance are unexpectedly long compared to the phase propagation time through the film (less than 1 nsec) computed from Pippard´s equations for eddy-current delay. Indeed, the normal phase appears to nucleate first in isolated regions from which it propagates laterally (i.e., in the plane of the film) to provide for a rather continuous increase in resistance from the time the pulse is started until the transition is complete. Thus, the major delay in the completion of the transition is probably associated with the time taken to propagate the phase between the various nucleation sites. The propagation distance, i.e., the distance between nucleation centers, is then calculated to be several microns. Methods of decreasing the delay time are discussed.
  • Keywords
    Delay effects; Indium; Isothermal processes; Magnetic fields; Magnetic films; Magnetic switching; Magnetic variables control; Propagation delay; Temperature control; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.2381
  • Filename
    1444311