• DocumentCode
    855310
  • Title

    Investigation of interfacial delamination of a copper-epoxy interface under monotonic and cyclic loading: modeling and evaluation

  • Author

    Xie, Weidong ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    26
  • Issue
    4
  • fYear
    2003
  • Firstpage
    441
  • Lastpage
    446
  • Abstract
    Interfacial delamination is of important concern for multilayered microelectronic packages, as it is one of the most common failures observed after reliability test. Most of the work, available in open literature, focus on delamination propagation under monotonic loading rather than delamination propagation under cyclic loading. Interfacial fracture mechanics based methodologies have been proven to be efficient in handling interfacial delamination problem under monotonic loading. In this paper, the principles of interfacial mechanics have been applied in the analysis of interfacial fatigue crack propagation. Fatigue test has been conducted in studying onset of delamination and fatigue crack propagation (FCP) of an interfacial crack along a copper-epoxy interface. Models developed in this study have also been applied in the evaluation of multilayered integrated substrate test vehicles.
  • Keywords
    ball grid arrays; copper; delamination; fatigue cracks; finite element analysis; fracture mechanics; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; internal stresses; plastic packaging; Cu; copper-epoxy interface; cyclic loading; fatigue crack propagation; fracture mechanics methodologies; interfacial delamination; interfacial integrity; monotonic loading; multilayered microelectronic packages; numerical modeling; plastic ball grid array; reliability test; Assembly; Delamination; Fatigue; Load modeling; Microelectronics; Plastic packaging; Surface cracks; Testing; Thermal loading; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2003.821087
  • Filename
    1257440