Title :
Enhanced Backscattering near 180° for Energetic Ions in Solids
Author :
Holland, O.W. ; Appleton, B.R. ; Barrett, J.H.
Author_Institution :
Solid State Division, Oak Ridge National Laboratory Oak Ridge, Tennessee 37830
fDate :
4/1/1981 12:00:00 AM
Abstract :
A new ion scattering effect which enhances backscattering yields near 180° has been recently reported. A computer program which simulates this scattering effect is discussed and the results compared with measurements. Both the angular distribution and depth profiles of the backscattered yield enhancements are compared. These comparisons verify the proposed explanation for the new scattering phenomena and a tentative explanation is offered for the small discrepancies which exist.
Keywords :
Amorphous materials; Backscatter; Computational modeling; Crystallization; Detectors; Geometry; Laboratories; Scattering; Solid modeling; Solid state circuits;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4331530
