Title :
Optical characterization of sputtered carbon films [magnetic media overlayers]
Author :
Ager, Joel W., III
Author_Institution :
Lawrence Berkeley Lab., California Univ., CA, USA
fDate :
1/1/1993 12:00:00 AM
Abstract :
Raman spectroscopy is nondestructive and relatively rapid and is well suited for the characterization of carbon films. The Raman spectra of a-C and a-C:H films consisting of two broad and overlapped features between 1000 and 1600 cm-1 have been obtained. Specific features in the Raman spectra are empirically correlated with the rates of specific types of mechanical wear for both hydrogenated and unhydrogenated films. This observation is interpreted in terms of a random covalent network, in which the mechanical performance of the film is determined by the nature of the bonding that links sp2-bonded domains
Keywords :
Raman spectra of inorganic solids; carbon; hydrogen; magnetic recording; noncrystalline state structure; sputtered coatings; wear; wear resistant coatings; 1000 to 1600 cm-1; C films; C:H films; Raman spectra; amorphous films; magnetic film media; mechanical performance; optical characterisation; overlayers; protective coatings; random covalent network; sp2-bonded domains; sputtered films; wear rates; Bonding; Magnetic films; Mechanical factors; Optical films; Optical sensors; Production; Protection; Raman scattering; Spectroscopy; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on
