Optical characterization of sputtered carbon films [magnetic media overlayers]

Author

Ager, Joel W., III

Author_Institution

Lawrence Berkeley Lab., California Univ., CA, USA

Volume

29

Issue

1

fYear

1993

fDate

1/1/1993 12:00:00 AM

Firstpage

259

Lastpage

263

Abstract

Raman spectroscopy is nondestructive and relatively rapid and is well suited for the characterization of carbon films. The Raman spectra of a-C and a-C:H films consisting of two broad and overlapped features between 1000 and 1600 cm^-1 have been obtained. Specific features in the Raman spectra are empirically correlated with the rates of specific types of mechanical wear for both hydrogenated and unhydrogenated films. This observation is interpreted in terms of a random covalent network, in which the mechanical performance of the film is determined by the nature of the bonding that links sp²-bonded domains

Keywords

Raman spectra of inorganic solids; carbon; hydrogen; magnetic recording; noncrystalline state structure; sputtered coatings; wear; wear resistant coatings; 1000 to 1600 cm^-1; C films; C:H films; Raman spectra; amorphous films; magnetic film media; mechanical performance; optical characterisation; overlayers; protective coatings; random covalent network; sp²-bonded domains; sputtered films; wear rates; Bonding; Magnetic films; Mechanical factors; Optical films; Optical sensors; Production; Protection; Raman scattering; Spectroscopy; Sputtering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.195579

Filename

195579