DocumentCode :
855404
Title :
The Hydrogen Content of Multicomponent Amorphous Silicon Alloys by 19F Nuclear Reaction Analysis
Author :
Allred, D.D. ; Booth, D.C. ; Appleton, B.R. ; Miller, P.D. ; Moak, C.D. ; Sellschop, J.P.F. ; White, C.W. ; Wintenberg, A.L.
Author_Institution :
University of Arizona
Volume :
28
Issue :
2
fYear :
1981
fDate :
4/1/1981 12:00:00 AM
Firstpage :
1838
Lastpage :
1840
Abstract :
Chemical vapor deposited (CVD) amorphous silicon alloyed with carbon or nitrogen (¿-Si:X, X=C or N) to retard high temperature crystallization is a promising absorber material for photothermal solar energy conversion. Films are prepared by decomposing silane containing gas mixures, a technique which is known to incorporate hydrogen into ¿-Si in some cases. Using the 16.45 MeV resonance of the 1H(19F,¿¿)16O reaction we made the first measurements of the hydrogen incorporation in CVD a-Si:X films (X=C,N). We have made three observations. First, the incorporation efficiency of hydrogen into CVD a-Si increases by a factor of twenty as the carbon content increases from 0 to 35 atomic percent which indicates that previous studies of multicomponent systems may need to be reevaluated since this enhancement in incorporation efficiency involves hydrogen--a key alloyant in a-Si. Second, the quantity of hydrogen incorporated increases at a greater than linear rate as a function of carbon content which implies that the presence of hydrogen in the films is not accidental but is a necessary part of film growth. Third, the hydrogen content of a-Si decreases to almost zero after high temperature anneal which may help explain reported shift in optical constants.
Keywords :
Amorphous silicon; Chemical vapor deposition; Crystalline materials; Crystallization; Hydrogen; Nitrogen; Optical films; Organic materials; Silicon alloys; Temperature;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1981.4331534
Filename :
4331534
Link To Document :
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