• DocumentCode
    855404
  • Title

    The Hydrogen Content of Multicomponent Amorphous Silicon Alloys by 19F Nuclear Reaction Analysis

  • Author

    Allred, D.D. ; Booth, D.C. ; Appleton, B.R. ; Miller, P.D. ; Moak, C.D. ; Sellschop, J.P.F. ; White, C.W. ; Wintenberg, A.L.

  • Author_Institution
    University of Arizona
  • Volume
    28
  • Issue
    2
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    1838
  • Lastpage
    1840
  • Abstract
    Chemical vapor deposited (CVD) amorphous silicon alloyed with carbon or nitrogen (¿-Si:X, X=C or N) to retard high temperature crystallization is a promising absorber material for photothermal solar energy conversion. Films are prepared by decomposing silane containing gas mixures, a technique which is known to incorporate hydrogen into ¿-Si in some cases. Using the 16.45 MeV resonance of the 1H(19F,¿¿)16O reaction we made the first measurements of the hydrogen incorporation in CVD a-Si:X films (X=C,N). We have made three observations. First, the incorporation efficiency of hydrogen into CVD a-Si increases by a factor of twenty as the carbon content increases from 0 to 35 atomic percent which indicates that previous studies of multicomponent systems may need to be reevaluated since this enhancement in incorporation efficiency involves hydrogen--a key alloyant in a-Si. Second, the quantity of hydrogen incorporated increases at a greater than linear rate as a function of carbon content which implies that the presence of hydrogen in the films is not accidental but is a necessary part of film growth. Third, the hydrogen content of a-Si decreases to almost zero after high temperature anneal which may help explain reported shift in optical constants.
  • Keywords
    Amorphous silicon; Chemical vapor deposition; Crystalline materials; Crystallization; Hydrogen; Nitrogen; Optical films; Organic materials; Silicon alloys; Temperature;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4331534
  • Filename
    4331534