Effects of thin Cr film thickness on CoNiCr/Cr sputtered hard disk

Author

Ishikawa, M. ; Terao, K. ; Hashimoto, M. ; Tani, N. ; Ota, Y. ; Nakamura, K.

Author_Institution

Ulvac Japan Ltd., Chiba, Japan

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

1602

Lastpage

1604

Abstract

The read/write properties of CoNiCr/Cr sputtered hard disks have been investigated in relation to the Cr underlayer film thickness. A high-temperature process, substrate bias, and a Cr-X target can be used to produce disks with the same coercivity and different Cr film thicknesses. It was found that B-δ, the output signal level at 5 MHz, and the recording density (D50) increased with decrease of Cr film thickness. It is suggested that the property improvements are realized due to the fine grain size, the decrease of actual CoNiCr layer thickness, and the increase of preferential growth of the c-axis of CoNiCr layer in the plane

Keywords

chromium; chromium alloys; cobalt alloys; coercive force; grain size; hard discs; magnetic disc storage; magnetic recording; magnetic thin films; nickel alloys; sputtered coatings; 5 MHz; CoNiCr layer thickness; CoNiCr-Cr; CoNiCr/Cr sputtered hard disk; Cr-X target; coercivity; fine grain size; high-temperature process; output signal level; preferential growth; read/write properties; recording density; substrate bias; thin Cr film thickness; underlayer film thickness; Cathodes; Chromium; Coercive force; Disk recording; Grain size; Hard disks; Magnetic films; Sputtering; Substrates; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104461

Filename

104461