DocumentCode
855580
Title
Linearity of breakdown voltage vs temperature in silicon avalanche diode
Author
Wang, W.C.
Volume
51
Issue
7
fYear
1963
fDate
7/1/1963 12:00:00 AM
Firstpage
1045
Lastpage
1045
Keywords
Diodes; Electromagnetic transients; Glass; Linearity; Plasma diagnostics; Pulse measurements; Silicon alloys; Space vector pulse width modulation; Temperature distribution; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.2408
Filename
1444338
Link To Document