Analysis of Key Factors for High Yield AMOLED Display

Author

Hojoong Kim ; Chanhyuk Jung ; Jang-Yeon Kwon ; Songkuk Kim

Author_Institution

Sch. of Integrated Technol., Yonsei Univ., Incheon, South Korea

Volume

11

Issue

9

fYear

2015

fDate

Sept. 2015

Firstpage

783

Lastpage

787

Abstract

To figure out the key factors of the reliability of AMOLED displays, we analyzed the luminance degradation based on a large-scale simulation. The initial non-uniformity and aging parameters were incorporated into the luminance decay model. For each set of parameters, we simulated the luminance degradation of 10,000 panels for 100,000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.

Keywords

LED displays; brightness; failure analysis; organic light emitting diodes; thin film transistors; AMOLED display reliability; TFT stability; active matrix organic light emitting diode; aging parameters; contrast deviation; failure determination; large-scale simulation; luminance decay model; luminance degradation; luminance variation; nonuniformity; Active matrix organic light emitting diodes; Aging; Degradation; Stability analysis; Standards; Thin film transistors; Displays; modeling; simulation; stability;

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2015.2451676

Filename

7154401