Title :
Analysis of Key Factors for High Yield AMOLED Display
Author :
Hojoong Kim ; Chanhyuk Jung ; Jang-Yeon Kwon ; Songkuk Kim
Author_Institution :
Sch. of Integrated Technol., Yonsei Univ., Incheon, South Korea
Abstract :
To figure out the key factors of the reliability of AMOLED displays, we analyzed the luminance degradation based on a large-scale simulation. The initial non-uniformity and aging parameters were incorporated into the luminance decay model. For each set of parameters, we simulated the luminance degradation of 10,000 panels for 100,000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.
Keywords :
LED displays; brightness; failure analysis; organic light emitting diodes; thin film transistors; AMOLED display reliability; TFT stability; active matrix organic light emitting diode; aging parameters; contrast deviation; failure determination; large-scale simulation; luminance decay model; luminance degradation; luminance variation; nonuniformity; Active matrix organic light emitting diodes; Aging; Degradation; Stability analysis; Standards; Thin film transistors; Displays; modeling; simulation; stability;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2015.2451676
