Title :
Effects of surface treatment of single-crystal MgO substrates on the growth and properties of YBa/sub 2/Cu3O/sub 7-y/ films
Author :
Suzuki, M. ; Sakurai, H. ; Takahashi, K.
Author_Institution :
Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
The preferred orientation and the inplane alignment of YBa/sub 2/Cu/sub 3/O/sub 7-y/ (YBCO) thin films deposited on MgO [100] substrates by on-axis DC magnetron sputtering have been investigated. The deposition temperature highly influences the preferred orientation of films. Films were oriented with the a-axis perpendicular to the substrates for low temperature depositions and with the c-axis for high temperature depositions. In the c-axis oriented films, there exist YBCO grains with the a(or b)-axis parallel to MgO [100] and 4-5/spl deg/ -rotated ones. 45/spl deg/ -rotated grains exclusively grow under the conditions of higher temperatures and on the substrates treated by acid-etching. The volume ratio between both types of YBCO grains is strongly connected with critical current density, even in the c-axis oriented films.<>
Keywords :
barium compounds; ceramics; critical current density (superconductivity); etching; grain boundaries; high-temperature superconductors; magnesium compounds; sputter deposition; superconducting thin films; yttrium compounds; MgO; YBa/sub 2/Cu/sub 3/O/sub 7/-MgO; YBa/sub 2/Cu3O/sub 7-y/ films growth; YBa/sub 2/Cu3O/sub 7-y/ films properties; acid-etching; critical current density; grains; high temperature depositions; high temperature superconductors; inplane alignment; low temperature depositions; on-axis DC magnetron sputtering; preferred orientation; single-crystal substrates; surface treatment; volume ratio; Critical current density; High temperature superconductors; Magnetic properties; Sputtering; Substrates; Superconducting films; Superconducting magnets; Superconducting transition temperature; Surface treatment; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on