DocumentCode :
85571
Title :
Tailoring Effect of Enhanced Local Electric Field From Metal Nanoparticles on Electroluminescence of Silicon-Rich Silicon Nitride
Author :
Feng Wang ; Dongsheng Li ; Deren Yang ; Duanlin Que
Author_Institution :
Dept. of Mater. Sci. & Eng., Zhejiang Univ., Hangzhou, China
Volume :
19
Issue :
3
fYear :
2013
fDate :
May-June 2013
Firstpage :
4602504
Lastpage :
4602504
Abstract :
The electroluminescence (EL) wavelength tailoring of silicon-rich silicon nitride (SiNx)-based light-emitting devices (LEDs) is achieved by the modulation of the dimensions of Ag nanoparticles. Two EL peaks are observed in our SiNx-based LEDs, both of which are red shifted with the increasing sizes of Ag nanoparticles. A reasonable explanation on this shift is proposed from the calculation of the local electric field surrounding Ag nanoparticles based on a simple model. This red shift of the two EL peaks as well as the evolution of their relative intensities is mainly originated from its weakening electric field enhancement with the increase of the size of Ag nanoparticles. Our work provides an alternative approach toward the fabrication of SiNx-based LEDs with tunable EL wavelengths.
Keywords :
electric fields; electroluminescence; light emitting diodes; nanoparticles; red shift; EL peaks; LED; electroluminescence wavelength tailoring; enhanced local electric field; light-emitting devices; metal nanoparticles; red shift; silicon-rich silicon nitride; tailoring effect; weakening electric field enhancement; Educational institutions; Electric fields; Electroluminescence; Light emitting diodes; Modulation; Nanoparticles; Silicon; Electroluminescence (EL); full-color display; light-emitting devices (LEDs); local electrical field; localized surface plasmons (LSPs); silicon-rich silicon nitride (SiN$_{x}$); wavelength tailoring;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2013.2252001
Filename :
6476628
Link To Document :
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